Tip-enhanced Raman scattering microscope TERSsense
Nano-Raman world observed by TERSsense
Small structure of Carbon Nanotubes and Graphene can be observed with TERSsense. The G-band intensity profile along white dotted line in the TERS image of CNTs demonstrates a spatial resolution of up to 14 nm. In the images of graphene, the distribution of armchair-edge is clearly observed. TERSsense opens up the unexplored nano-Raman world with a spatial resolution beyond the diffraction limit.
Key features of TERSsense
Tip-enhanced Raman scattering microscope TERSsense developed by Nanophoton is realized by the technology transfer from Prof. Kawata’s laboratory and Phtonics center of Osaka University. Utilizing the fabrication technology of probes developed by Kawata lab, TERSsense guarantees the enhancement of Raman light and high reproducibility of TERS measurement. Every probe is inspected before shipping and delivered to our customers with performance guarantee. In contrast to gap-mode arrangement, there is no need to have a sample sandwiched between a metal probe and a metal-coated substrate. And, the adoption of transmission configuration of TERSsense makes it possible implement extremely sensitive measurement, with the utilization of a high NA(1.40) objective lens.
What is the tip-enhanced Raman scattering (TERS) microscope?
Tip-enhanced Raman scattering (TERS) microscope is a kind of Raman microscope which provides infinitely higher spatial resolution beyond the diffraction limit. TERS microscope is an instrument that combines laser Raman microscope and atomic force microscope (AFM) equipped with a cantilever probe coated by metal. The metal nano-structure at the tip of probe enhances Raman scattered light locally and as a result, nanometer spatial resolution can be obtained.