High Resolution Raman Imaging of Carbon Nanotubes
▼ Overlapping image of 4 different RBMs
▼ Raman image of each RBM distribution
- 532 nm
- 100x, 0.90NA
- Number of Spectra
- 13,200 *Only a part of whole image is shown.
- Measurement time
- 16 minutes
The images above show Raman images of a carbon nanotube field-effect transistor (CNT-FET). Many types of CNTs are distributed between two electrodes (upper and lower side of Raman image) and they can be observed minutely by high-resolution Raman imaging of RAMANforce. According to the Kataura plot, each single-walled carbon nanotube (SWNT) can be identified as semiconductor- or metal-SWNT by position of RBM peaks.
*This sample is provided by Prof. Shigeo Maruyama at The University of Tokyo.
Confocal Laser Raman Microscope RAMANforce >>>
Pixel by pixel analysis is possible by intuitive software
▼ RBM peaks at different area in Raman image
▼ G-band intensity image
▲ RBM peak observed area
The graph on the left shows the averaged spectra in each selected region indicated in the lower right Raman image. Each spectrum is indicated by the same number. From the transit of RBM peaks from No.1 to No.8, it can be observed that CNTs with different chiralities overlap with each other and distribute between the electrodes.
RAMANforce software is able to show the instant spectrum by clicking and dragging at desired point or area. Moreover, the coloring function provides an easy and efficient tool for spectrum comparison.
Nanophoton's Raman imaging systems are highly appreciated by nano-carbon researchers
2012 A3 Symposium, Tohoku University, Japan
Nanophoton's laser Raman microscope is widely used for nano-carbon related researches because of its high spatial resolution and ultra-fast imaging capability. Nanophoton joined A3 symposium as a single sponsor by courtesy of Prof. Riichiro Saito of Tohoku University (picture above) and keeps sponsoring many conferences regarding nano-carbon materials.