This is a measurement function that recognizes the surface shape of a sample from an optical microscope image and performs Raman imaging along the surface shape. Even with samples that have been uneven due to surface irregularities, it is possible to obtain clear Raman images without blurring. Optical microscope images and Raman images can be displayed according to the surface shape, and the relationship of the distribution of the material with irregularities can also be checked.

By scanning line illumination at high speed in the vertical direction, it is possible to acquire a wide range of average spectrum with one exposure. In addition to being wide measurement area, the 400 spectra on the CCD are integrated into a single spectrum, resulting in very sensitive data. Using AreaFlash, you can compare average spectra between samples and easily track changes over time in the spectrum.

By combining the motorized stage and the AreaFlash, a wide range of spectrum mapping measurements can be realized at high speed.
Although it was difficult to measure a wide area without gaps only with stage scanning, it is possible to measure the entire sample without gaps by combining it with laser scanning. AreaFlash provides very sensitive spectra, allowing measurement in a short time, even over a wide range.

Example of wide-field AreaFlash for a tablet. A pixel size is around 400µm, 20 x 20 pixels.​

It is a function to measure the average spectrum of 6mm x 6mm at a time by scanning the laser on the line at high speed with a low NA (0.04) objective lens. For tablets, because the diffusion effect can provide information up to a depth of about 0.5 mm inside, about 18 mm³ of volume area is the target of Raman measurement.

*Patented

RAMANtouch has an internal reference sample for calibration. By measuring the reference sample by laser scanning, wavenumber calibration can be performed without placing the calibration sample on the stage. Since wavenumber calibration can be performed even during measurement, it is possible to correct slight changes in peak position due to changes in room temperature during measurement by measuring the spectrum of the reference sample at regular intervals. It works particularly well for long-term measurements.

Using confocal optics, which detects Raman light inside the sample nondestructively, a 3D Raman image of a transparent sample can be obtained. This function repeats ultra-fast XY Raman imaging using line illumination several times while changing the stage height, and stacks the slices to create a 3-dimensional image in memory. By using the high imaging speed and depth resolution of RAMANtouch/RAMANforce, a more intuitive understanding can be obtained of the internal structure and component distribution inside a sample.

RAMANtouch/RAMANforce has a brand-new wide field-of-view (FOV) Raman imaging capability. It automatically measures the surface height of a sample while capturing a wide FOV microscopic image, and makes it possible to measure a wide FOV Raman image with auto-focusing. As the images show on the right, a fine focused Raman image can be obtained from all over the surface of a curved tablet.

The measurement algorithm is further improved to speed up the imaging 3 times faster than our previous RAMANtouch model.

Wide FOV imaging of curved surface of a tablet

This function detects particles in a microscopic image, and Raman measurements are automatically carried out with quick auto-focus. Fully utilizing our fast and accurate laser beam scanning technology, Nanophoton has developed three different measurement modes: “auto point measurement at center of each particle”, “auto scanning of whole surface of each particle to get averaged spectrum”, and “auto Raman mapping of each particle with arbitrary scanning pitch”. Detected spectra are automatically identified using a real-time spectrum search during measuring. Measuring and analysis according to size classes as defined by ISO 16232 is also possible.

Detect partcles automatically in microscopic image

3 useful measurement modes

This function is to obtain a quantitative analysis of component dispersiveness such as uniformity, aggregational states and locality in a Raman image. Such can be investigated from every possible angle by counting the number of particle outlines along an evaluation axis such as (X and Y) or (r and θ), or calculating the standard deviation of number of particles in a (grid) or (Voronoi diagram) layout.

It is a function to execute the registered analysis function at one time. A series of processes can be easily performed on data for which analysis procedures have been determined.